| Manufacturer: | createc |
| Model: | LT-STM/AFM |
| Facility: | Chair of Materials Science and Nanotechnology | Partner: | TU Dresden |
| Location: | BAR S77E |
Since 2000, the low-temperature scanning tunneling microscope (LT-STM) is an essential part of CreaTec's product range. In addition to its nanoanalytical capabilities, it allows the precise manipulation of atoms and molecules at temperatures from 4 to 300 K. Starting with our proven beetle-type STM with highest spectroscopy performance, we have continuously developed this instrument to three different scanning probe systems: a 4 K LT-STM, a combined 4 K LT-STM/AFM, and a 1 K LT-STM system.
The 4 K microscopes are available as beetle-type scanners and PAN-type sliders, with different options like e.g. magnetic field, optical access and high-frequency cabling. All these microscopes offer ultimate STM, STS and IETS performance including one of the longest LHe hold times, extremely low drift rates and outstanding stability (dz<1 pm) compared to similar low-temperature SPM systems. State-of-the-art spectroscopy and atom manipulation can be performed on metals, semiconductors, insulators, superconductors and carbon at low temperatures. The 4 K LT-STM/AFM is also well adapted for experiments at variable temperatures ranging from 5 to 300 K. Our fully compatible low-temperature atomic force microscope (AFM) was introduced in 2007 allowing for simultaneous measurements of force and tunneling current without cross-talk using constant frequency or constant height control.
Main Features
LT-STM/AFM + MiniMBE
Combined MBE growth and LT-STM/AFM
High quality surface preparation
Fast and reliable transfer
Optimized for high resolution, state-of- the-art LT-STM and AFM measurements
Base temperature below 5 K Lowest LN2 and LHe consumption
Long-term low-temperature spectroscopy and atom manipulation
Powerful software package included
| Manufacturer: | createc |
| Model: | LT-STM/AFM |
| Facility: | Chair of Materials Science and Nanotechnology | Partner: | TU Dresden |
| Location: | BAR S77E |
Since 2000, the low-temperature scanning tunneling microscope (LT-STM) is an essential part of CreaTec's product range. In addition to its nanoanalytical capabilities, it allows the precise manipulation of atoms and molecules at temperatures from 4 to 300 K. Starting with our proven beetle-type STM with highest spectroscopy performance, we have continuously developed this instrument to three different scanning probe systems: a 4 K LT-STM, a combined 4 K LT-STM/AFM, and a 1 K LT-STM system.
The 4 K microscopes are available as beetle-type scanners and PAN-type sliders, with different options like e.g. magnetic field, optical access and high-frequency cabling. All these microscopes offer ultimate STM, STS and IETS performance including one of the longest LHe hold times, extremely low drift rates and outstanding stability (dz<1 pm) compared to similar low-temperature SPM systems. State-of-the-art spectroscopy and atom manipulation can be performed on metals, semiconductors, insulators, superconductors and carbon at low temperatures. The 4 K LT-STM/AFM is also well adapted for experiments at variable temperatures ranging from 5 to 300 K. Our fully compatible low-temperature atomic force microscope (AFM) was introduced in 2007 allowing for simultaneous measurements of force and tunneling current without cross-talk using constant frequency or constant height control.
Main Features
LT-STM/AFM + MiniMBE
Combined MBE growth and LT-STM/AFM
High quality surface preparation
Fast and reliable transfer
Optimized for high resolution, state-of- the-art LT-STM and AFM measurements
Base temperature below 5 K Lowest LN2 and LHe consumption
Long-term low-temperature spectroscopy and atom manipulation
Powerful software package included
